Mitigating Single Event Upsets

ثبت نشده
چکیده

The Soft Error Rate (SER) is expressed as Failure-in-Time (FIT) units, defined as one soft error occurrence every billion hours of operation.Often SEUmitigation is not required because of the low chance of occurrence. However, for highly complex systems, such as with multiple high-density components, error rate may be a significant system design factor. If your system includes multiple FPGAS and requires very high reliability and availability, you should consider the implications of soft errors, and use the available techniques for detecting and recovering from these types of errors. If your system is requiring high reliability and availability, consider the implications of soft errors, and use the techniques in this document to detect and recover from these types of errors.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Mitigating bit flips or single event upsets in epilepsy neurostimulators☆

OBJECTIVES The objective of this study was to review software errors known as single event upsets (SEUs) or bit flips due to cosmic rays in epilepsy neurostimulators. MATERIALS AND METHODS A case report of a single event upset or bit flip is discussed; device manufacturers and publicly available data were queried for both incidence and types of error as well as strategies of software error mi...

متن کامل

Reduced Precision Redundancy for Satellite Telecommand Receiver Module on FPGA

A novel and highly efficient design of a Software defined radiation tolerant baseband module for a LEO satellite telecommand receiver using FPGA is presented. FPGAs in space are subject to Single Event Upsets (SEUs) due to high radiation environment. Traditionally, Triple Modular Redundancy (TMR) is used for mitigating Single Event Upsets (SEUs). The drawback of using TMR is that it consumes a ...

متن کامل

Mitigating Single - Event Upsets

www.xilinx.com 1 © Copyright 2012 Xilinx, Inc. Xilinx, the Xilinx logo, Artix, ISE, Kintex, Spartan, Virtex, Zynq, and other designated brands included herein are trademarks of Xilinx in the United States and other countries. All other trademarks are the property of their respective owners. Occasionally, electronic devices exhibit erroneous behavior for no apparent reason. Through careful exper...

متن کامل

Mitigating Single-Event Upsets (WP395)

www.xilinx.com 1 © Copyright 2012–2015 Xilinx, Inc. Xilinx, the Xilinx logo, Artix, ISE, Kintex, Spartan, Virtex, Vivado, Zynq, and other designated brands included herein are trademarks of Xilinx in the United States and other countries. All other trademarks are the property of their respective owners. Occasionally, electronic devices exhibit erroneous behavior for no apparent reason. Through ...

متن کامل

Applying Residue Arithmetic Codes to Combinational Logic to Reduce Single Event Upsets_RADECS_2013

Mitigating Single Event Upsets (SEU) in combinatorial logic is conventionally accomplished through redundancy based Radiation Hardening By Design (RHBD) methods such as Triple Module Redundancy (TMR). A hardening technique based on residue arithmetic codes (RAC) is proposed as a lower overhead alternative for detecting and correcting SEUs in arithmetic logic units. Simulations and analyses at t...

متن کامل

Overview and Investigation of SEU Detection and Recovery Approaches for FPGA-based Heterogeneous Systems

Growing international interest in the development of space missions based on low-cost nano-/microsatellites demands new approaches to the design of reliable, low-cost, reconfigurable digital processing platforms. To meet these requirements, future systems will need to include applicationspecific processors to handle control-dominated tasks and hardware accelerators to cope with data-intensive w...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2014